Fault Diagnosis of Analog Integrated Circuits

Contents: Dedication. Preface. I. Introduction: 1. Basic concepts. 2. Historical background. 3. Summary. References. II. Fault and fault modelling: 1. Introduction. 2. Failure modes in electronic components. 3. Analog fault modelling. 4. Approximation modelling of analog integrated circuits. 5. Summary. Exercises. References. III. Test stimulus generation: 1. Introduction. 2. Conventional analog test stimulus generation. 3. Digital test stimulus generation. 4. Delta Sigma (D-å) signal generation. 5. Pseudorandom noise generation. 6. Summary. Exercises. References. IV. Fault diagnosis methodology: 1. Introduction. 2. Fault diagnosis procedure. 3. Fault dictionary techniques. 4. DSP based techniques. 5. Model based observer technique. 6. Experimental verification of the model based observer technique. 7. Summary. Exercises. References. V. Design for testability and built-in-self-test: 1. Introduction. 2. Design-for-testability approaches. 3. Increased testability with test bus. 4. Built-in-self-test. 5. Summary. References. Appendixes. Notes. Index.

"System On Chip (SOC) having both digital and analog circuits has become increasingly prevalent in integrated circuit manufacturing industry. Electronic tests are classified as digital, analog and mixed signal. Current methodologies for the testing of digital circuits are well developed. In contrast, methodologies for the testing of analog circuits remain relatively underdeveloped due to the complex nature of analog signals. Compared to digital testing, analog testing lags far behind in methodologies and tools and therefore demands substantial research and development effort.

The objective of this book is to study the testing and fault diagnosis of analog and analog parts of mixed signal circuits. A background in analog integrated circuits, artificial neural networks is desirable but not essential. The text covers the testing and fault diagnosis of both Bipolar and Metal Oxide Semiconductor (MOS) circuits. Fault models of the devices in the analog domain have introduced in the text. The test stimulus generations are also discussed in detail. Experimental verification of some state-of-the-art techniques has also been presented in the book. It also contains problems that can be used as quiz or homework. This book enables the reader to test an analog circuit that is implemented either in bipolar or MOS technology."